Special Issue/Trends and Future of Corrosion Measurement Techniques. Scanning Probe Microscope.
نویسندگان
چکیده
منابع مشابه
Studying of various nanolithography methods by using Scanning Probe Microscope
The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...
متن کاملStudying of various nanolithography methods by using Scanning Probe Microscope
The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...
متن کاملMechanical Analysis and Measurement of Scanning Probe Microscope Performance
Euler beam theory and Lagrangian mechanical analysis have been applied to the beetle-style scanning probe microscope (SPM) system to predict the natural frequencies for two significant vibrational modes. In the first mode, the three piezoelectric legs vibrate transversely and the scan head moves from side to side, and in the second, the legs bend tangentially and the scan head twists about its ...
متن کاملScanning Probe Microscope Techniques for the Engineering of Nanoelectronic Devices
Using CNT network sensors as our working example, we review AFM-based techniques which are used to study and engineer nanoelectronic devices. We have used dc-EFM and ac-EFM to identify the locations and resistances of individual CNTs that are electrically connected in parallel. Next, 5GM and tm-SGM were used to reveal the semiconducting response of each CNT. With the information available in th...
متن کاملSwitchable Stiffness Scanning Microscope Probe
Atomic Force Microscopy (AFM) has rapidly gained widespread utilization as an imaging device and micro/nano-manipulator during recent years. This thesis investigates the new concept of a dual stiffness scanning probe with respect to biological applications and determines the resulting requirements for the scanning of soft bio samples, such as lowpressure contact. On this basis, an in-plane AFM ...
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ژورنال
عنوان ژورنال: Journal of the Surface Finishing Society of Japan
سال: 1994
ISSN: 0915-1869,1884-3409
DOI: 10.4139/sfj.45.992